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Delegation of CSEI Visited BAM and BASF

Published:2017-06-27 10:20:26.0  Publisher:admin
   
On June 5th to 9th, a three-person delegation led by Mrs. Liang Lihong Deputy Director of NDT Center of CSEI visited the non-destructive testing technology center (NDT) of BAM and BASF.

During the visit, Dr. Uwe Ewert, the principal from BAM Radiographic Testing Lab and Dr. Liang Lihong introduced the new NDT technology of their units, and exchanged information on the research of new NDT technology. They also visited BAM RT and CT Lab, Acoustic Testing Lab, Electromagnetic Testing Lab and Concrete Testing Technology Lab, and hold discussion with researchers about relevant technology.

Then, accompanied by Mr. Berthold Schreieck, principal of BASF NDT Department, they visited BASF NDT Lab. Both parties discussed on NDT technology and methods for in-service products and application of NDT new technology in chemical enterprises.


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